J. Randa
Identifiers
- Open LibraryOL440482A
Top Subjects
- Impedance matching (1)
- Current noise (Electricity) (1)
- Semiconductor wafers -- Testing (1)
- Electronic noise -- Measurement (1)
- Measurement (1)
- Electromagnetic noise (1)
- Radiometers (1)
Books by J. Randa
Total count: 3
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Noise temperature measurements on waferFor sale by the Supt. of Docs., U.S. G.P.O.1997-01-01
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Uncertainties in NIST noise-temperature measurementsU.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology1998-01-01
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Noise-temperature measurement system for the WR-28 bandU.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology1998-01-01