R. V Heckman

Identifiers

Open LibraryOL4725291A

Top Subjects

Thickness measurement (2)
Beta rays -- Scattering (2)
Minicomputers (1)

Books by R. V Heckman

Total count: 2

High-precision thickness measurements using beta backscatter

for sale by the National Technical Information Service]1978-01-01
Development of a semi-automatic Beta-backscatter thickness-measuring systemfinal reportRev

Dept. of Energy1979-01-01