Electron microscopes -- Congresses

Electron-optical methods in clay science

by A.J. Brearley ... [et al.] ; edited by I.D.R. Mackinnon, F.A. Mumpton.

Modern diffraction and imaging techniques in material science: proceedings of the internationam summer course, July 28-August 8, 1969

Spnsored by NATO Scientific Affairs Division. Editors : S. Amerlickx, R. Gevers, G. Remaut [and others].

Proceedings of the 14th annual Electron Microscopy Colloquium

Francis C. Laabs, editor

Microscopie électronique 1970: [i.e. dix-neuf cent soixantedix], résumés des communications présentées au 7e Congrès international, Grenoble, 30 août-5 septembre 1970.

Édité par Piere Favard.

Techniques of electron microscopy, diffraction, and microprobe analysis.

Presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963.

Proceedings.

AMU-ANL High Voltage Electron Microscope Meeting (1964 Argonne National Laboratory)

Electron microscopy: 6th International Congress forElectron Microscopy, held in Kyoto, Japan, August 28th to September 4th, 1966

edited by Ryozi Uyeda.

Electron microscopy in materials science: third course of the International School of Electron Microscopy

editors, U. Valdrè and E. Ruedl.

Nanotekunorojī Sōgō Shien Purojekuto Wākushoppu: LEEM/PEEM o mochiita hyōmen kenkyū no atarashii tenkai : PF Kenkyūkai = Progresses in low energy electron microscopy and photoemission electron microscopy studies (LEEM & PEEM)

Koshikawa Takanori ... [et al.].

Proceedings: thirty-first annual meeting, Electron Microscopy Society of America, New Orleans, Louisiana, August 14, 15, 16, and 17, 1973

edited by Claude J. Arceneaux.