Measuring instruments -- Congresses

Laser technology VII.: 23-27 September, 2002, Szczecin-Świnoujście, Poland

Wiesław Woliński, Zdzisław Jankiewicz, Ryszard Romaniuk, editors ; organized by, Committee of Electronics and Telecommunications, Polish Academy of Sciences ... [et al.] ; sponsored by State Committee for Scientific Research (Poland), SPIE--the International Society for Optical Engineering in association with the SPIE Poland Chapter ; published by SPIE--the International Society for Optical Engineering.

Metrologicheskoe obespechenie i standartizat͡sii͡a: tezisy dokladov XI Vseakademicheskoĭ mezhdunarodnoĭ shkoly po problemam metrologicheskogo obespechenii͡a i standartizat͡sii, Sankt-Peterburg, 9-14 senti͡abri͡a, 1993 g.

[otvetstvennyĭ redaktor Solomenko N.S. ... et al.].

Laser technology VII.: 23-27 September, 2002, Szczecin-Świnoujście, Poland

Wiesław Woliński, Zdzisław Jankiewicz, Ryszard Romaniuk, editors ; organized by, Committee of Electronics and Telecommunications, Polish Academy of Sciences ... [et al.] ; sponsored by State Committee for Scientific Research (Poland), SPIE--the International Society for Optical Engineering in association with the SPIE Poland Chapter ; published by SPIE--the International Society for Optical Engineering.

Proceedings of CIRP Conference on Precision Engineering and Manufacturing System : Tianjin, China, September 12-14, 1991

[sponsor, International Institution for Production Engineering Research ; organizers, Tianjin University, Production Engineering Institution of Chinese Mechanical Engineering Society ; editorial committee, R.J. Hocken ... [et al.].

Proceedings of the 35th International Instrumentation Symposium, May 1-4, 1989, Orlando Marriott Hotel, International Drive, Orlando, Florida

sponsored by Aerospace Industries Divison and Test Measurement Division of the Instrument Society of America.

Metrology in industrial instrumentation: proceedings from the 1977 spring industry oriented conference, Anaheim, California

[programmed by ISA's Metrology Division].

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4th International Symposium on Dimensional Metrology in Production and Quality Control.

International Symposium on Dimensional Metrology in Production and Quality Control (4th 1992 Tampere, Finland)

Opticheskie skanirui͡u︡shchie ustroĭstva i izmeritelʹnye pribory na ikh osnove: tezisy dokladov k pi͡a︡tomu Vsesoi͡u︡znomu soveshchanii͡u︡

[nauchnyĭ redaktor P.I. Gosʹkov].

Izmeritelʹnye preobrazovateli s izmeneniem fizicheskoĭ prirody vkhodnoĭ velichiny: sekt͡sii͡a 3 : Tezisy dokladov Vsesoi͡uznoĭ nauchno-tekhnicheskoĭ konferent͡sii "Voprosy teorii i proektirovanii͡a analogovykh izmeritelʹnykh preobrazovateleĭ".

Vsesoi͡uznai͡a nauchno-tekhnicheskai͡a konferent͡sii͡a "Voprosy teorii i proektirovanii͡a analogovykh izmeritelʹnykh preobrazovateleĭ" (1978 Ulʹi͡anovsk, R.S.F.S.R.)