Optical methods

Optical Inspection of Microsystems Second Edition

Wolfgang Osten

Optical inspection of microsystems

edited by Wolfgang Osten.

Computer vision, models, and inspection

A.D. Marshall and R.R. Martin.

Image processing: machine vision applications IV : 25-27 January 2011, San Francisco, California, United States

David Fofi, Philip R. Bingham, editors ; sponsored ... by IS&T--The Society for Imaging Science and Technology, SPIE

Two- and Three-dimensional Methods for Inspection and Metrology

Peisen S. Huang

Machine vision applications in industrial inspection IX: 22-23 January 2001, San Jose, [California] USA

Martin A. Hunt, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering.

Atmospheric sensing and modeling: 29-30 September 1994, Rome, Italy

Richard P. Santer, chair/editor ; sponsored by the Commission of the European Communities, Directorate General for Science, Research, and Development ... [et al.].

In-process optical measurements: ECO1, 22-23 September 1988, Hamburg, Federal Republic of Germany

Kenneth H. Spring, chair/editor ; sponsored by EPS--European Physical Society, Europtica--the European Federation for Applied Optics, SPIE--the International Society for Optical Engineering ; cooperating organizations, ANRT-- Association nationale de la recherche technique ... [et al.].

Remote sensing of trace constituents in the lower stratosphere, troposphere and the earth's surface : global observations, air pollution and the atmospheric correction: proceedings of the A1.2 symposium of COSPAR Scientific Commission A which was held during the thirty-third COSPAR Scientific Assembly, Warsaw, Poland, July, 2000

edited by J.P. Burrows and N. Takeuchi.

The Electro-optical instrumentation market for quality & production control in the U.S.

Frost & Sullivan