X-ray microscopy and X-ray microanalysis
proceedings. Edited by A. Engström, V. Cosslett [and] H. Pattee
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Author
Publication
1960 - Elsevier, Amsterdam, New York, Netherlands
Language
English
Word Count
135,500 words, Guess
Page Count
542 pages
Identifiers
- Open LibraryOL58331375M
- OCLC Control Number14558788
- Library of Congress Control Number60012354
Classifications
- LCCQC373.X2 I5 1959
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