Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices IX
25-26 January 2010, San Francisco, California, United States
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Contributions
- SPIE (Society) - Contributor
Publication
2010 - SPIE, Bellingham, Wash, Washington (State)
Language
English
Word Count
0 words, Guess
Page Count
0 pages
Identifiers
- ISBN-100819479888
- ISBN-139780819479884
- Library of Congress Control Number2011293397
- OCLC Control Number642855931
- Open LibraryOL25202755M
Classifications
- LCCTK7875 .R438 2010
Series Statement
- Proceedings of SPIE -- v. 7592
- Proceedings of SPIE--the International Society for Optical Engineering -- v. 7592.
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