Discover the new world of test and design
International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA
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Contributions
- IEEE Computer Society. Test Technology Technical Committee. - Contributor
- Institute of Electrical and Electronics Engineers. Philadelphia Section. - Contributor
Publication
1992 - The Conference, Altoona, PA, Pennsylvania
Language
English
Word Count
253,000 words, Guess
Page Count
1,012 pages
Identifiers
- ISBN-100780307607
- ISBN-100818631678
- ISBN-10081863166X
- ISBN-139780780307605
- ISBN-139780818631672
and 3 more
- ISBN-139780818631665
- Library of Congress Control Number92073585
- Open LibraryOL1750840M
Classifications
- DDC621.3815/028/7
- LCCTK7874 .I474 1992
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