Testing and reliable design of CMOS circuits
Our rough guess is there are 57,750 words in this book.
At a pace averaging 250 words per minute, this book will take 3 hours and 51 minutes to read. With a half hour per day, this will take 8 days to read.
How long will it take you?
This book will take an estimated to read at a reading speed averaging words per minute. With 30 minutes per day, this will take to read.
Enter your reading speedYou can take one of our WPM reading speed tests to find your reading speed.
Create a free account to track your reading progress, build your reading list, and set reading goals.
Get it on Amazon
We earn a commission on purchases
Author
Contributions
- Kundu, Sandip. - Contributor
Publication
1990 - Kluwer Academic Publishers, Boston, Massachusetts
Language
English
Word Count
57,750 words, Guess
Page Count
231 pages
Identifiers
- Open LibraryOL2214034M
- ISBN-100792390563
- OCLC Control Number20490432
- OCLC Control Numberrepublicfthunder00geff
- Library of Congress Control Number89037031
and 1 more
- Goodreads3104176
Classifications
- DDC621.39/732
- LCCTK7871.99.M44 J49 1990
Subjects
Topics
TestingReliabilityIntegrated circuitsDesign and constructionVery large scale integrationComplementary Metal oxide semiconductorsMetal oxide semiconductors, complementaryMetal oxide semiconductors, Complementary -- Testing.Metal oxide semiconductors, Complementary -- Reliability.Integrated circuits -- Very large scale integration -- Design and construction.
Series Statement
- Kluwer international series in engineering and computer science ;
Reader Reviews
No reviews yet for this book.
Be the first to share your thoughts!