Charge loss modeling for EPROMs with ONO interpoly dielectric
1. Aufl.
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Author
Publication
1994 - Hartung-Gorre Verlag, Konstanz, [Germany, Germany
Language
English
Description
"The investigations presented in this work identify the origin of intrinsic long term charge loss in EPROMs with ONO interploy dielectric and model the charge transport through the ONO dielectric as a function of electric field and temperature"--Abstract.
Subjects
Topics
Series Statement
- Series in microelectronics,
- volume 42
- v. 42.
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