Reliability and Failure of Electronic Materials and Devices
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Author
Publication
2014 - Elsevier Science & Technology Books
Language
English
Word Count
189,500 words, Guess
Page Count
758 pages
Identifiers
- ISBN-139780080575520
- ISBN-100080575528
- Better World Books9780080575520
- Open LibraryOL33439687M
Subjects
Other Editions
- Reliability and Failure of Electronic Materials and Devices
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