Influence of temperature on microelectronics and system reliability
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Author
Contributions
- Pecht, Michael. - Contributor
- Hakim, Edward B. - Contributor
Publication
1997 - CRC Press, Boca Raton, Florida
Language
English
Word Count
76,750 words, Guess
Page Count
307 pages
Identifiers
- ISBN-100849394503
- ISBN-139780849394508
- Goodreads1698567
- Library of Congress Control Number96039038
- Better World Books9780849394508
and 1 more
- Open LibraryOL1000154M
Classifications
- DDC621.381/046
- LCCTK7870.25 .L35 1997
- LCCTK7870.25.L35 1997
Subjects
Topics
MaterialsMatériauxFiabilitéTECHNOLOGYElectricityReliabilityMicroelectronicsMicroélectroniqueThermal propertiesElectronic packagingPropriétés thermiquesAppareils électroniquesMicroelectronic packagingElectronic apparatus and appliancesMise sous boîtier (Microélectronique)Electronic apparatus and appliances -- ReliabilityMicroelectronics -- Materials -- Thermal properties
Series Statement
- The electronic packaging series
Other Editions
- Influence of temperature on microelectronics and system reliability
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