High-resolution X-ray scattering from thin films and lateral nanostructures
2nd ed.
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Publication
2004 - Springer, New York, NY
Language
English
Word Count
102,000 words, Guess
Page Count
408 pages
Identifiers
- Open LibraryOL22599349M
- ISBN-100387400923
- OCLC Control Number53903576
- Library of Congress Control Number2003070360
- Goodreads2361442
Classifications
- LCCQC
Subjects
Other Editions
- High-resolution X-ray scattering from thin films and lateral nanostructures
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