IEEE International Conference on Microelectronic Test Structures (1997 Monterey, Calif.), Institute Of Electrical and Electronics Engineers, IEEE Electron Devices Society

1997 IEEE International Conference on Microelectronic Test Structures proceedings

March 17-20, 1997, Monterey, California

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Author

Contributions

IEEE Electron Devices Society. - Contributor

Publication

1997 - IEEE Service Center, Piscataway, NJ, Washington (State)

Language

English

Word Count

56,250 words, Guess

Page Count

225 pages

Identifiers

ISBN-100780332431
ISBN-10078033244X
ISBN-100780332458
ISBN-139780780332430
ISBN-139780780332447

and 2 more

ISBN-139780780332454
Open LibraryOL20769976M

Classifications

LCCTK7874 .I3237 1997

Alternate Titles

IEEE International Conference on Microelectronic Test Structures proceedings
International Conference on Microelectronic Test Structures proceedings

Subjects

Topics

Testing Congresses Electricity Microelectronics Integrated circuits Science/Mathematics Electronic Measurements

Other Editions

1997 IEEE International Conference on Microelectronic Test Structures proceedings: March 17-20, 1997, Monterey, CaliforniaIEEE Service Center1997-01-01

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