Electro-Thermal Simulation Studies of Sic Junction Diodes Containing Screw Dislocations under High Reverse-Bias Operation
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Publication
2018 - Independently Published
Language
English
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Page Count
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Identifiers
- ISBN-139781723722479
- ISBN-101723722472
- Better World Books9781723722479
- Open LibraryOL40562852M
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