Publication

2013 - Springer, New York, New York (State)

Language

English

Word Count

47,000 words, Guess

Page Count

188 pages

Identifiers

  • ISBN-10146142268X
  • ISBN-139781461422686
  • Library of Congress Control Number2012943974
  • OCLC Control Number819941203
  • Better World Books9781461422686
and 1 more

Classifications

  • DDC621.395
  • LCCTK7874 .V375 2013
  • LCCTK7867-7867.5

Description

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects. It teaches them the state-of-the-art in Variation-Aware Design tools, which help the designer to analyze quickly the variation effects, identify the problems, and fix the problems. Furthermore, this book describes the algorithms and algorithm behavior/performance/limitations, which is of use to designers considering these tools, designers using these tools, CAD researchers, and CAD managers--

Subjects

Similar Books

Reader Reviews

No reviews yet for this book.

Be the first to share your thoughts!