Quantitative x-ray spectrometry
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Author
Contributions
- Gould, Robert William. - Contributor
- Gedcke, Dale, 1939- - Contributor
Publication
1981 - M. Dekker, New York, New York (State)
Language
English
Word Count
146,500 words, Guess
Page Count
586 pages
Identifiers
- ISBN-100824712668
- ISBN-139780824712662
- Goodreads4312150
- LibraryThing8311059
- Library of Congress Control Number81003289
and 2 more
- OCLC Control Number7459415
- Open LibraryOL4257795M
Classifications
- DDC545/.836
- LCCQD96.X2 J46
Description
This thoroughly revised and updated Second Edition of an incomparable hands-on reference covers every important aspect of x-ray spectrometry - from basic principles to the selection of instrument parameters and sample preparation. With over 1100 equations, figures, tables and bibliographic citations, Quantitative X-ray Spectrometry, Second Edition is an invaluable resource for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists, and graduate-level and continuing-education students in these disciplines.
Subjects
Topics
Other Editions
- Quantitative x-ray spectrometry
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