1995 IEEE International Reliability Physics Proceedings
33rd Annual Las Vegas, Nevada, April 4, 5, 6, 1995 (International Reliability Physics Symposium Proceedings)
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Publication
1995-12-01 - Institute of Electrical & Electronics Enginee
Language
English
Word Count
101,250 words, Guess
Page Count
405 pages
Physical Format
Paperback
Identifiers
- ISBN-10078032031X
- ISBN-139780780320314
- Goodreads6882213
- LibraryThing5455971
- Open LibraryOL10998629M
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