VLSI Design and Test
17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
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Publication
2013 - Springer London, Limited
Language
English
Word Count
101,500 words, Guess
Page Count
406 pages
Identifiers
- ISBN-139783642420245
- ISBN-103642420249
- Better World Books9783642420245
- Open LibraryOL37236079M
Classifications
- LCCTK7885-7895
Description
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.
Subjects
Other Editions
- VLSI Design and Test
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