Reliability of MEMS (Advanced Micro and Nanosystems)
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Contributions
- Osamu Tabata (Editor) - Contributor
- Toshiyuki Tsuchiya (Editor) - Contributor
- Oliver Brand (Series Editor) - Contributor
- Gary K. Fedder (Series Editor) - Contributor
- Christofer Hierold (Series Editor) - Contributor
and 1 more
- Jan G. Korvink (Series Editor) - Contributor
Publication
2008-02-15 - Wiley-VCH
Language
English
Word Count
81,000 words, Guess
Page Count
324 pages
Physical Format
Hardcover
Identifiers
- ISBN-103527314946
- ISBN-139783527314942
- Library of Congress Control Number2008459617
- Better World Books9783527314942
- Open LibraryOL12767479M
Classifications
- LCCTK7874
- LCCTK7875 .R437 2008
Subjects
Other Editions
- Reliability of MEMS (Advanced Micro and Nanosystems)
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