Contributions

  • Osamu Tabata (Editor) - Contributor
  • Toshiyuki Tsuchiya (Editor) - Contributor
  • Oliver Brand (Series Editor) - Contributor
  • Gary K. Fedder (Series Editor) - Contributor
  • Christofer Hierold (Series Editor) - Contributor
and 1 more
  • Jan G. Korvink (Series Editor) - Contributor

Publication

2008-02-15 - Wiley-VCH

Language

English

Word Count

81,000 words, Guess

Page Count

324 pages

Physical Format

Hardcover

Identifiers

  • ISBN-103527314946
  • ISBN-139783527314942
  • Library of Congress Control Number2008459617
  • Better World Books9783527314942
  • Open LibraryOL12767479M

Classifications

  • LCCTK7874
  • LCCTK7875 .R437 2008

Subjects

Other Editions

  • Reliability of MEMS (Advanced Micro and Nanosystems)HardcoverWiley-VCH2008-02-15

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