Failure mechanisms in semiconductor devices
2nd ed.
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Author
Contributions
- Najm, Farid N. - Contributor
Publication
1997 - J. Wiley, Chichester, England
Language
English
Word Count
86,250 words, Guess
Page Count
345 pages
Identifiers
- Open LibraryOL1009924M
- ISBN-100471954829
- OCLC Control Number503314232
- Library of Congress Control Number96049978
- Goodreads5721109
and 1 more
- LibraryThing3367529
Classifications
- DDC621.3815/2
- LCCTK7871.852 .A47 1997
Subjects
Topics
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