Metal Impurities in Silicon- and Germanium-Based Technologies
Origin, Characterization, Control, and Device Impact
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Author
Publication
2018-08-14 - Springer
Word Count
109,500 words, Guess
Page Count
438 pages
Physical Format
Hardcover
Identifiers
- ISBN-103319939246
- ISBN-139783319939247
- Better World Books9783319939247
- Open LibraryOL27764255M
Classifications
- LCCQC374-379
Subjects
Topics
Other Editions
- Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact
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