Contributions

  • Swaminathan, V. - Contributor
  • Pearton, S. J. - Contributor
  • Manasreh, Mahmoud Omar. - Contributor
  • Materials Research Society. - Contributor

Publication

1990 - Materials Research Society, Pittsburgh, Pa, Pennsylvania

Language

English

Word Count

67,250 words, Guess

Page Count

269 pages

Identifiers

  • Open LibraryOL1883737M
  • ISBN-101558990739
  • OCLC Control Number22209537
  • Library of Congress Control Number90044597
  • Goodreads3581736

Classifications

  • DDC621.381/52
  • LCCTK7871.85 .D455 1990

Subjects

Topics

FailuresCongressesReliabilitySemiconductorsSemiconductors -- Failures -- Congresses.Semiconductors -- Reliability -- Congresses.

Series Statement

  • Materials Research Society symposium proceedings,

Other Editions

  • Degradation mechanisms in III-V compound semiconductor devices and structures: symposium held April 17-18, 1990, San Francisco, California, U.S.A.Materials Research Society1990-01-01

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