Test resource partitioning for system-on-a-chip
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Contributions
- Iyengar, Vikram. - Contributor
- Chandra, Anshuman. - Contributor
Publication
2002 - Kluwer Academic Publishers, Boston, Massachusetts
Language
English
Word Count
58,000 words, Guess
Page Count
232 pages
Identifiers
- ISBN-101402071191
- ISBN-139781402071195
- Library of Congress Control Number2002069402
- Better World Books9781402071195
- Open LibraryOL18176251M
Classifications
- LCCTK7895.E42 C453 2002
- LCCTK7888.4TK1-9971TA34
Subjects
Topics
TestingTechnologySystems on a chipScience/MathematicsIntegrated CircuitsComputer EngineeringElectronics - GeneralComputer architectureElectronic MeasurementsGeneral Theory of ComputingSystems on a chip -- TestingTechnology & Industrial ArtsElectronic devices & materialsPlug and play (Computer architComputer Architecture - GeneralComputers : Computer EngineeringElectronics - Circuits - IntegratedPlug and play (Computer architecture)Engineering - Electrical & ElectronicTechnology / Engineering / ElectricalTechnology / Electronics / Circuits / GeneralTechnology : Electronics - Circuits - Integrated
Series Statement
- Frontiers in electronic testing -- 20.
Other Editions
- Test resource partitioning for system-on-a-chip
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