Secondary Ion Mass Spectrometry SIMS IV
Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983
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Author
Contributions
- Okano, J. - Contributor
- Shimizu, R. - Contributor
- Werner, H. W. - Contributor
Publication
1984 - Springer Berlin Heidelberg, Berlin, Heidelberg, Germany
Language
English
Word Count
0 words, Guess
Page Count
0 pages
Physical Format
[electronic resource] :
Identifiers
- Open LibraryOL27086762M
- ISBN-139783642822582
- ISBN-103642822584
- OCLC Control Number851373185
- OCLC Control Numbersecondaryionmass1983sigm
Classifications
- DDC541
- LCCQD450-882
Subjects
Series Statement
- Springer Series in Chemical Physics -- 36
Other Editions
- Secondary Ion Mass Spectrometry SIMS IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983
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