Leakage in Nanometer CMOS Technologies (Series on Integrated Circuits and Systems)
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Author
Contributions
- Siva G. Narendra (Editor) - Contributor
- Anantha Chandrakasan (Editor) - Contributor
Publication
2005-11-17 - Springer
Language
English
Word Count
79,250 words, Guess
Page Count
317 pages
Identifiers
- Internet Archiveleakagenanometer00nare_353
- Internet Archiveleakagenanometer00nare
- Internet Archiveleakagenanometer00nare_163
- Internet Archiveleakagenanometer00nare_643
- ISBN-100387257373
and 7 more
- ISBN-139780387257372
- LibraryThing5760819
- Goodreads877633
- Library of Congress Control Number2005932184
- Better World Books9780387257372
- Better World BooksO7-ALS-177
- Open LibraryOL7444857M
Classifications
- LCCTK7871.99.M44 L43 2006
- LCCTK7867-7867.5
First Sentence
Benefits of CMOS technology scaling in the nanometer regime comes with the disruptive consequence of increasing MOS transistor leakages.
Subjects
Other Editions
- Leakage in Nanometer CMOS Technologies (Series on Integrated Circuits and Systems)
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