CTL for test information of digital ICs
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Author
Publication
2003 - Kluwer Academic Publishers, Boston, Massachusetts
Language
English
Word Count
43,250 words, Guess
Page Count
173 pages
Identifiers
- Internet Archivectlfortestinform0000kapu
- ISBN-101402072937
- ISBN-139781402072932
- Goodreads1639389
- Library of Congress Control Number2002034094
and 3 more
- Better World Books9781402072932
- Better World BooksO9-BAO-004
- Open LibraryOL19288714M
Classifications
- DDC621.3815/48
- LCCTK7874.65 .K35 2003
- LCCTK7867-7867.5
Subjects
Topics
TestingStandardsDigital integrated circuitsComputer hardware description languagesDigital integrated circuits -- Testing -- Standards
Other Editions
- CTL for test information of digital ICs
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