Breakdown phenomena in semiconductors and semiconductor devices
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Author
Contributions
- Kostamovaara, Juha. - Contributor
- Vainshtein, Sergey. - Contributor
Publication
2005 - World Scientific, Singapore, Singapore
Language
English
Word Count
52,000 words, Guess
Page Count
208 pages
Identifiers
- ISBN-109812563954
- ISBN-139789812563958
- Goodreads7014385
- LibraryThing5762815
- Library of Congress Control Number2006273468
and 3 more
- OCLC Control Number62473250
- Better World Books9789812563958
- Open LibraryOL22736424M
Classifications
- DDC621.38152
- LCCTK7871.85 .L463 2005
- LCCQC711.8.B7 L49 2005
and 1 more
- LCCTK7871.85.L463 2005
Subjects
Series Statement
- Selected topics in electronics and systems -- v. 36
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