New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices
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Author
Publication
2013 - Elsevier Science & Technology Books
Language
English
Word Count
27,500 words, Guess
Page Count
110 pages
Identifiers
- ISBN-139780128000175
- ISBN-100128000171
- Better World Books9780128000175
- Open LibraryOL34493370M
Classifications
- LCCTK7874.76.Z35 2014eb
Subjects
Other Editions
- New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices
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