25th anniversary compendium of papers from International Test Conference
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Author
Contributions
- Institute of Electrical and Electronics Engineers. - Contributor
- IEEE Computer Society. - Contributor
- IEEE Computer Society. Philadelphia Chapter. - Contributor
Publication
1994 - IEEE Computer Society Press, Los Alamitos, Calif, California
Language
English
Word Count
198,500 words, Guess
Page Count
794 pages
Identifiers
- ISBN-10081866617X
- ISBN-139780818666179
- Goodreads3128776
- Library of Congress Control Number94077462
- OCLC Control Number31440992
and 1 more
- Open LibraryOL1131204M
Classifications
- DDC621.39/5/0287
- LCCTK7874 .I593 1994
Alternate Titles
- Compendium of papers from International Test Conference.
- Twenty-fifth anniversary compendium of papers from International Test Conference.
Subjects
Topics
TestingCircuitsCongressesLogic DesignIntegrated circuitsScience/MathematicsProgramming - GeneralElectronic digital computersProgramming Languages - GeneralComputers - Languages / ProgrammingComputer Bks - Languages / ProgrammingIntegrated circuits -- Testing -- CongressesElectronic digital computers -- Circuits -- Testing -- Congresses
Other Editions
- 25th anniversary compendium of papers from International Test Conference
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