Electrical impact of SiC structural crystal defects on high electric field devices
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Author
Contributions
- NASA Glenn Research Center. - Contributor
Publication
1999 - National Aeronautics and Space Administration, Glenn Research Center, Cleveland, Ohio, Ohio
Language
English
Word Count
0 words, Guess
Page Count
0 pages
Physical Format
Microform
Identifiers
- Open LibraryOL15571732M
Series Statement
- [NASA technical memorandum] -- NASA/TM-1999-209647.
- NASA technical memorandum -- 209647.
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