Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
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Author
Contributions
- SpringerLink (Online service) - Contributor
Publication
2011 - Springer Science+Business Media, LLC, New York, NY, New York (State)
Language
English
Word Count
0 words, Guess
Page Count
0 pages
Physical Format
[electronic resource] /
Identifiers
- Open LibraryOL25542546M
- ISBN-139781441978165
- OCLC Control Numberatomicscalechara00walk
Classifications
- LCCTP807-823TA418.9.C6Q
Subjects
Topics
MaterialsChemistryMicroreactorsSemiconductorsMicroengineeringMaterials scienceCeramic materialsBuilding materialsPhysical organic chemistrySpectroscopy and MicroscopyScanning electron microscopesPhysical and theoretical ChemistryAtomic/Molecular Structure and SpectraCeramics, Glass, Composites, Natural Methods
Series Statement
- Springer Theses
Other Editions
- Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
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