Hot-carrier reliability of MOS VLSI circuits
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Author
Contributions
- Leblebici, Yusuf. - Contributor
- Kang, Sung-Mo, 1945- - Contributor
Publication
1993 - Kluwer Academic, Boston, Massachusetts
Language
English
Word Count
53,000 words, Guess
Page Count
212 pages
Identifiers
- Open LibraryOL1407075M
- ISBN-10079239352X
- OCLC Control Number27937993
- Library of Congress Control Number93015447
- Goodreads4302844
Classifications
- DDC621.39/5
- LCCTK7874 .L334 1993
Subjects
Topics
DefectsReliabilityHot carriersMathematical modelsIntegrated circuitsMetal oxide semiconductorsVery large scale integrationIntegrated circuits, very large scale integrationHot carriers -- Reliability -- Mathematical modelsMetal oxide semiconductors -- Reliability -- Mathematical modelsIntegrated circuits -- Very large scale integration -- Defects -- Mathematical models
Series Statement
- The Kluwer international series in engineering and computer science ;
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