ICMTS 93
proceedings of the 1993 International Conference on Microelectronic Test Structures, March 22-25, 1993, Sitges, Barcelona, Spain
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Author
Contributions
- IEEE Electron Devices Society. - Contributor
Publication
1992 - IEEE, New York, N.Y, New York (State)
Language
English
Word Count
74,250 words, Guess
Page Count
297 pages
Identifiers
- ISBN-100780308573
- ISBN-100780308581
- ISBN-139780780308572
- ISBN-139780780308589
- ISBN-10078030859
and 2 more
- ISBN-13078030859
- Open LibraryOL20812426M
Classifications
- LCCTK7870 .I14 1993
Alternate Titles
- Proceedings of the 1993 International Conference on Microelectronic Test Structures.
- 1993 IEEE International Conference on Microelectronic Test Structures.
Subjects
Topics
Other Editions
- ICMTS 93: proceedings of the 1993 International Conference on Microelectronic Test Structures, March 22-25, 1993, Sitges, Barcelona, Spain
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