Distributed testing of a device-level interface specification for a metrology system
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Author
Contributions
- Horst, John Albert. - Contributor
- National Institute of Standards and Technology (U.S.) - Contributor
Publication
2002 - U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, Gaithersburg, MD, Maryland
Language
English
Word Count
4,750 words, Guess
Page Count
19 pages
Physical Format
Microform
Identifiers
- Open LibraryOL17607544M
- OCLC Control Number50263005
Subjects
Series Statement
- NISTIR -- 6851.
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