2005 IEEE International Test Conference (Itc)
8-10 November, 2005, Austin, TX
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Publication
2005 - Institute of Electrical & Electronics Enginee
Language
English
Word Count
330,750 words, Guess
Page Count
1,323 pages
Physical Format
Hardcover
Identifiers
- ISBN-100780390385
- ISBN-139780780390386
- Library of Congress Control Number2006280338
- Open LibraryOL11000608M
Classifications
- LCCTK7874 .I474 2005
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