Interferometry XI
applications, 10-11 July 2002, Seattle USA
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Author
Contributions
- Osten, Wolfgang. - Contributor
- Society of Photo-optical Instrumentation Engineers. - Contributor
- Boeing Company. - Contributor
Publication
2002 - SPIE, Bellingham, Wash., USA, Washington (State)
Language
English
Word Count
121,500 words, Guess
Page Count
486 pages
Identifiers
- ISBN-100819445452
- ISBN-139780819445452
- Library of Congress Control Number2003268336
- OCLC Control Number50492745
- Open LibraryOL17983341M
Classifications
- DDC535/.47/0287
- LCCTA1540 .I55 2002
Alternate Titles
- Interferometry 11
- Interferometry eleven
Subjects
Topics
CongressesMeasurementInterferometryIndustrial applicationsMeasurement -- CongressesInterferometry -- Industrial applications -- Congresses
Genres
- Congresses
Series Statement
- SPIE proceedings series -- v. 4778
- Proceedings of SPIE--the International Society for Optical Engineering -- v. 4778.
Other Editions
- Interferometry XI
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