Yip-wah Chung

Micro- and nanoscale phenomena in tribology

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Author

Yip-wah Chung

Publication

2012 - CRC Press, Boca Raton, Florida

Language

English

Word Count

0 words, Guess

Page Count

0 pages

Identifiers

ISBN-139781439839225
ISBN-101439839220
Library of Congress Control Number2011036207
OCLC Control Number763161409
Better World Books9781439839225

and 1 more

Open LibraryOL25066826M

Classifications

DDC621.8/9
LCCTJ1075 .M524 2012
LCCTJ1075

and 1 more

LCCTJ1075 .M524 2012eb

Subjects

Topics

Tribology Nanotechnology TECHNOLOGY & ENGINEERING Tribologie (Technologie)

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