Secondary Ion Mass Spectrometry SIMS III
Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30-September 5, 1981
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Author
Contributions
- Giber, J. - Contributor
- László, J. - Contributor
- Riedel, M. - Contributor
- Werner, H. W. - Contributor
Publication
1982 - Springer Berlin Heidelberg, Berlin, Heidelberg, Germany
Language
English
Word Count
0 words, Guess
Page Count
0 pages
Physical Format
[electronic resource] :
Identifiers
- Open LibraryOL27086761M
- ISBN-139783642881541
- ISBN-103642881548
- OCLC Control Number851370182
- OCLC Control Numbersecondaryionmass1981rden
Classifications
- DDC530.41
- LCCQC176-176.9
Subjects
Series Statement
- Springer Series in Chemical Physics -- 19
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