Terry L. Alford, L. C. Feldman, James W. Mayer

Fundamentals of Nanoscale Film Analysis

We couldn't estimate the reading time for this book.

Author

Publication

2007 - Springer

Language

English

Word Count

0 words, Guess

Page Count

0 pages

Identifiers

ISBN-139780387292618
ISBN-100387292616
Better World Books9780387292618
Open LibraryOL37108470M

Classifications

LCCTA418.5-.84

Subjects

Topics

Thin films Nanostructured materials

Reader Reviews

No reviews yet for this book.

Be the first to share your thoughts!