Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Application to Rough and Natural Surfaces (NanoScience and Technology)
1 edition
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Word Count
73,000 words, Guess
Page Count
292 pages
Physical Format
Hardcover
Identifiers
- Open LibraryOL9055858M
- ISBN-139783540284055
- ISBN-103540284052
- OCLC Control Number71008043
- OCLC Control Numberatomicforcemicro00kaup
and 2 more
- Library of Congress Control Number2006923691
- Goodreads3288797
Classifications
- LCCQH212.A78 K38 2006
First Sentence
Atomic force microscopy (AFM) is also known as scanning force microscopy (SFM).
Subjects
Topics
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