Study of Bulk and Elementary Screw Dislocation Assisted Reverse Breakdown in Low-Voltage (Less Than 250 V) 4h-Sic P(+)N Junction Diodes. Part 1; DC Properties
We couldn't estimate the reading time for this book.
Publication
2018 - Independently Published
Language
English
Word Count
0 words, Guess
Page Count
0 pages
Identifiers
- ISBN-139781728883731
- ISBN-101728883733
- Better World Books9781728883731
- Open LibraryOL40947522M
Subjects
Reader Reviews
No reviews yet for this book.
Be the first to share your thoughts!