Close-range photogrammetric measurement of static defections for an aeroelastic supercritical wing
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Author
Contributions
- Adams, Richard R. - Contributor
- Sandford, M. C. - Contributor
- United States. National Aeronautics and Space Administration. Scientific and Technical Information Division. - Contributor
Publication
1990 - National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division, Washington, DC, District of Columbia
Language
English
Word Count
22,250 words, Guess
Page Count
89 pages
Physical Format
Microform
Identifiers
- OCLC Control Number32381396
- Open LibraryOL17114223M
Alternate Titles
- Close range photogrammetric measurement of static defections for an aeroelastic supercritical wing
Subjects
Series Statement
- NASA technical memorandum -- 4194
Other Editions
- Close-range photogrammetric measurement of static defections for an aeroelastic supercritical wing
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