Testing and Reliable Design of CMOS Circuits
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Author
Contributions
- Kundu, Sandip - Contributor
Publication
1990 - Springer US, Boston, MA, Massachusetts
Language
English
Word Count
64,000 words, Guess
Page Count
256 pages
Physical Format
Electronic resource
Identifiers
- Open LibraryOL27091429M
- ISBN-139781461288183
- ISBN-101461288185
- OCLC Control Number852790106
Classifications
- DDC620.00420285
- LCCTA345-345.5
- LCCTA345-345.5TK1-9971
Subjects
Series Statement
- The Kluwer International Series in Engineering and Computer Science, VLSI, Computer Architecture and Digital Signal Processing -- 88
- Kluwer international series in engineering and computer science -- 88.
Other Editions
- Testing and Reliable Design of CMOS Circuits
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