Trace-Based Post-Silicon Validation for VLSI Circuits
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Word Count
27,000 words, Guess
Page Count
108 pages
Physical Format
Paperback
Identifiers
- ISBN-103319375946
- ISBN-139783319375946
- Better World Books9783319375946
- Open LibraryOL29492968M
Classifications
- LCCTK7867-7867.5
Subjects
Other Editions
- Trace-Based Post-Silicon Validation for VLSI Circuits
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