Proceedings of the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
1 edition
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Author
Contributions
- L. J Balk - Editor
Publication
2000-10-01 - PERGAMON PRESS
Language
English
Word Count
77,500 words, Guess
Page Count
310 pages
Physical Format
Hardcover
Identifiers
- Open LibraryOL9978793M
- ISBN-100080439152
- ISBN-139780080439150
- OCLC Control Number228214820
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