Analytische Beschreibung des Degradationsverhaltens von Submikrometer-MOS-Bauelementen durch heisse : Ladungsträger
Experimente, Modellbildung und Simulation für schaltungstechnische Anwendungen
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Author
Contributions
- Technische Universität Berlin - Contributor
Publication
1991 - , Germany
Language
German
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Identifiers
- OCLC Control Number50871223
- Open LibraryOL55234469M
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