Transistor Scaling: Methods, Materials and Modeling
Symposium Held April 18-19, 2006, San Francisco, California, U.S.A. (Materials Research Society Symposium Proceedings)
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Word Count
51,250 words, Guess
Page Count
205 pages
Physical Format
Hardcover
Identifiers
- Open LibraryOL8609188M
- ISBN-139781558998698
- ISBN-101558998691
- OCLC Control Number77118277
- Library of Congress Control Number2007295481
Classifications
- LCCTK7871.9 .T7185 2006
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