Manufacturing Yield Evaluation of Vlsi/Wsi Systems
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Author
Publication
1995-12-01 - Institute of Electrical & Electronics Enginee
Language
English
Word Count
109,250 words, Guess
Page Count
437 pages
Physical Format
Paperback
Identifiers
- ISBN-100818662921
- ISBN-139780818662928
- Open LibraryOL11389879M
Subjects
Topics
TechnologyReliabilityLogic DesignData processingIntegrated circuitsScience/MathematicsCircuits & componentsProgramming - GeneralDesign and constructionWafer-scale integrationReliability EngineeringGeneral Theory of ComputingVery large scale integrationElectronics - Circuits - VLSIComputers - General InformationVery-Large-Scale Integration (Vlsi)Computer architecture & logic design
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