Atom-probe field ion microscopy and its applications
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Author
Contributions
- Sakai, A. - Contributor
- Pickering, H. W. - Contributor
Publication
1989 - Academic Press, Boston, Massachusetts
Language
English
Word Count
74,750 words, Guess
Page Count
299 pages
Identifiers
- Open LibraryOL2263940M
- ISBN-100120145820
- OCLC Control Number19694669
- OCLC Control Numberatomprobefieldio0000saku
- Library of Congress Control Number89147603
and 1 more
- Goodreads3994070
Classifications
- DDC502/.8/2
- LCCQH212.A76 S25 1989
Subjects
Series Statement
- Advances in electronics and electron physics.
- 20
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